Congratulations to Nick Lawrence, Mingren Shen, Ruiqi Yin, and Cloris Feng for their excellent work on using machine learning to accelerate electron microscopy modeling. The work showed how Generative Adversarial Neural Networks (GANs) could be used to generate high fidelity electron microscopy simulations from low fidelity starting points. The results were impressive, but did not improve on an earlier Skunkworks effort using simpler linear regression, so we have published the paper only on ArXiv for now. Please see https://arxiv.org/abs/2010.15315